|
Step |
Name |
Description/Requirements |
Img# |
|
1 |
Wafer Reception |
Wafers obtained sliced from boule - 4" Diameter
<100> Si |
1 |
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2 |
Boron Implantation |
P type implant doping of silicon (5x10^12/cm^2) |
2 |
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3 |
Piranha Cleaning |
Wafer cleaned with 10:1 H2SO4 Piranha solution
to remove organics |
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4 |
Drive-in Annealing |
120min placement in Oxidation Furnace for
annealing |
3 |
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5 |
Field-Oxidation Deposition |
Wet Oxide Process - 5000A thickness target |
4 |
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6 |
Thickness Measurement |
Nanospec test from each quadrant to check for
uniform thickness |
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7 |
Demos |
Demos and Introduction to Lab Safety |
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8 |
Dehydration Bake - 5min |
Dry off excess moisture from wafer
surface/bottom which can stick to devices |
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9 |
HMDS Coating - 10min |
Improves adhesion of photoresist |
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10 |
Apply Photoresist/Prebake |
Applies a layer of photoresist to which we will
expose the mask. |
5 |
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11 |
Active Mask |
Apply active mask to photoresist prior to
development |
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12 |
Development |
Develop for 60 seconds in Developer solution |
6 |
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13 |
Post-Bake |
For 120min @ 120C to complete the development
process |
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14 |
Plasma Etching |
Dry etching process is used to etch photoresist
w/ minimal undercutting |
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15 |
Wet Etching |
6:1 BOE solution - Wet etching process |
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16 |
Inspection |
Using the nanospec, check to ensure that
oxide/silicon is properly etched |
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17 |
Strip photoresist |
Using 4:1 Piranha solution to remove organics |
7 |
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18 |
RCA1 + RCA2 Cleaning |
Strip the organic and inorganic matrials from
the wafer |
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19 |
Dry Oxide Growth - Gate |
In oxidation furnace - 30min - Target thickness
600A |
8 |
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20 |
LPCVD Poly Deposition |
Used to deposit uniform layer of poly on the
wafer - Target thickness 2000A |
9 |
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21 |
Oxide/Poly Thickness Nanospec |
Check above steps by TA for correct
measurements. |
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22 |
Dehydration Bake - 5min |
Dry off excess moisture from wafer
surface/bottom which can stick to devices |
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23 |
HMDS Coating - 10min |
Improves adhesion of photoresist |
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24 |
Apply Photoresist/Prebake |
Applies a layer of photoresist to which we will
expose the mask. |
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25 |
Poly Mask |
Apply poly mask to photoresist prior to
development |
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26 |
Development |
Develop for 60 seconds in Developer solution |
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27 |
Post-Bake |
For 120min @ 120C to complete the development
process |
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28 |
Post-Bake |
For 120min @ 120C to complete the development
process |
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29 |
Plasma Etching |
Dry etching process is used to etch photoresist
w/ minimal undercutting |
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30 |
Polysilicon Etch |
DRIE Plasma etch - defines the gate of the NMOS |
10 |
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31 |
Nanospec Inspection |
Check for Poly Thickness/Gate Oxide thickness
under 20A |
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32 |
Backside Poly Etch |
The process used above deposits poly on both
sides of the wafer, so the backside must also be
etched - Approximately 5 minutes |
11 |
|
33 |
Wet Oxide Etch |
Etch oxide for approximately 5.5min in 6:1 BOE
Solution |
12 |
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34 |
4-Point Probe Inspection |
Check for resistance values of monitor bars. |
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35 |
Strip photoresist |
Using 4:1 Piranha solution to remove organics |
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36 |
Ion Implantation Procedure |
Since we are using a self aligned
Source/Gate/Drain, Ion implantation is
necessary. Phosphorous implant done on the
frontside/Boron implant done on the backside |
13 |
|
37 |
RCA Cleaning Procedure |
Strip organic and metallic elements off the
wafer |
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38 |
Activation Anneal |
Activation is required to activate the implanted
atoms and repair any damage caused by the
annealing process |
14 |
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39 |
LTO Oxide Deposition |
LPCVD Furnace deposition - Target Thickness
5000A |
15 |
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40 |
Dehydration Bake - 5min |
Dry off excess moisture from wafer
surface/bottom which can stick to devices |
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41 |
HMDS Coating - 10min |
Improves adhesion of photoresist |
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42 |
Apply Photoresist/Prebake |
Applies a layer of photoresist to which we will
expose the mask. |
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43 |
Contact Mask |
Apply contact mask to photoresist prior to
development |
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44 |
Development |
Develop for 60 seconds in Developer solution |
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45 |
Post-Bake |
For 120min @ 120C to complete the development
process |
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46 |
Plasma Etching |
Dry etching process is used to etch photoresist
w/ minimal undercutting - 2min |
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47 |
Wet Etching |
6:1 BOE solution - Wet etching process - One
wafer for 5min, second for 9min |
16 |
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48 |
Inspection |
Using the nanospec, check monitor bar
measurements Poly/ S/D / Con/ & Schottky |
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49 |
4-Point Probe measurements |
Measure monitor bars and check resistance values |
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50 |
RCA1 + RCA2 Cleaning |
Strip the organic and inorganic matrials from
the wafer |
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51 |
Aluminum Sputtering |
Frontside Target 5000A / Backside Target 2500A |
17 |
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52 |
Dehydration Bake - 5min |
Dry off excess moisture from wafer
surface/bottom which can stick to devices |
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53 |
HMDS Coating - 20min |
Improves adhesion of photoresist. This step was
doubled for increased adhesion during this
process. |
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54 |
Apply Photoresist / Prebake |
Applies a layer of photoresist to which we will
expose the mask. |
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55 |
Metal Mask |
Apply metal mask to photoresist prior to
development |
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56 |
Development |
Develop until proper color change is seen. |
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57 |
Post-Bake |
For 120min @ 120C to complete the development
process |
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58 |
Backside Photoresist / Prebake |
Applies a layer of photoresist to the backside.
Done to protect the backside Aluminum during the
etching. |
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59 |
Plasma Etching |
Dry etching process is used to etch photoresist
w/ minimal undercutting - 2min |
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60 |
Metal Etching |
Very fast procedure (overetching is not
recommended and can kill the device). Etch
until red photoresist shows - approximately
7min) |
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61 |
Plasma Etching |
Dry etching process is used to etch photoresist
w/ minimal undercutting - 2min |
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62 |
Sintering of Metal |
Creates a good ohmic contact between the
Aluminum and Silicon |
18 |
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63 |
Measurements |
Characterization of all required devices using
Probes |
19 |